IEEE Transactions on Reliability Editorial Board

Editorial Board


Editor in Chief


Winston Shieh
Winston Shieh

National Yang Ming Chiao Tung University
Taiwan

Associate Editors


Iftekhar AhmedUniversity of California IrvineUSA
J. Morris ChangUniversity of South FloridaUSA
Yu-Wen ChenCity University of New YorkUSA
Pau-Chen ChengIBMUSA
Byoungju ChoiEwha Woman’s UniversityKorea
Sabrina De Capitani di VimercatiUniversity of MilanItaly
Joanna DeFrancoPenn State UniversityUSA
Ruizhi GaoSonos Inc.USA
Roberto GuancialeKTH Royal Institute of TechnologySweden
Abdelwahab Hamou-LhadjConcordia UniversityCanada
Chin-Yu HuangNational Tsing Hua UniversityTaiwan
Sun-Yuan HsiehNational Cheng Kung UniversityTaiwan
He JiangDalian University of TechnologyChina
Hiroaki KikuchiMeiji UniversityJapan
Rick KuhnNational Institute of Standards and TechnologyUSA
Srdan KrsticETH ZürichSwitzerland
Phil LaplanteNational Institute of Standards and TechnologyUSA
Chi-Yu LiNational Yang Ming Chiao Tung UniversityTaiwan
Yingjiu (Joe) LiUniversity of OregonUSA
Hui LinUniversity of Rhode IslandUSA
Yi-Kuei LinNational Yang Ming Chiao Tung UniversityTaiwan
Yun LinHarbin Engineering UniversityChina
Yu LiuUniversity of Electronic Science and Technology of ChinaChina
David LoSingapore Management UniversitySingapore
Leo LuanIBM Research – AlmadenUSA
Lei MaUniversity of AlbertaCanada
Hon Keung Tony NgBentley UniversityUSA
Ed PohlUniversity of ArkansasUSA
Alexander PretschnerTechnical University of MunichGermany
Jason RupeCableLabsUSA
Yulei SuiUniversity of New South WalesAustralia
Hung-Min SunNational Tsing Hua UniversityTaiwan
Sharareh TaghipourToronto Metropolitan UniversityCanada
Takeshi TakahashiNational Institute of Information and Communications TechnologyJapan
Zhiyuan TanEdinburgh Napier UniversityUK
Felix WuUC DavisUSA
YuSung WuNational Yang Ming Chiao Tung UniversityTaiwan
Ming-Hour YangChung Yuan Christian UniversityTaiwan
Shunkun YangBeihang UniversityChina
Zhisheng YeNational University of SingaporeSingapore
Zheng ZhengBeihang UniversityChina